Multi-angle energy-dispersive x-ray diffraction

Energy-dispersive X-ray diffraction (EDXD) in Paris-Edinburgh cell (PEC)

Multi-angle EDXD technique up to 39° in 2qangle is available for measurement of structure of liquids and solids at high pressure and high temperature in PEC.  Collimation tip provides good control of collimation depth (Figure 1), which is important for discriminating the weak liquid signal from background scattering.  Figure 2 shows an example EDXD spectra obtained for SiO2 glass at 2qangle between 2.0° and 34.9°, and the analyzed structure factor, S(q).  The analysis software package (aEDXD) is available at HPCAT.